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Proceedings Paper

Traceability of spectroradiometric measurements of multiport UV solar simulators
Author(s): Cai-hong Dai; Zhi-feng Wu; Xiao-jin Qi; Jing Ye; Bin-hua Chen
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Paper Abstract

A special multiport UV solar simulator was designed at National Institute of Metrology (NIM), and a set of UVA and UVA+B optical filters were developed to satisfy the spectral distribution specifications of COLIPA SPF and JCIA Persistent Pigmentation Darkening (PPD) test methods. The other purpose of this apparatus is used to calibrate the UVA and UVA+B irradiance or dose of broadband UV radiometers. The response of a double grating spectroradiometer with a 5.8 mm entrance aperture from 250nm to 800nm was calibrated using a 1000W spectral irradiance standard lamp at a distance of 500 mm, and the value of quantities of the developed system is traceable to the national primary standard of spectral irradiance of NIM. The system wavelength was checked using a low-pressure mercury lamp. The spectral response of each port was measured from 250nm to 800nm in 1nm steps. Experiment results showed that the percentage relative cumulative erythemal effectiveness (% RCEE) and UVA measurement waveband values of the multiport UV solar simulator are within the specified limits. The source spectrum is smooth and continuous, and the energy below 290nm is less than 0.1%.

Paper Details

Date Published: 30 August 2013
PDF: 7 pages
Proc. SPIE 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications, 891002 (30 August 2013); doi: 10.1117/12.2030753
Show Author Affiliations
Cai-hong Dai, National Institute of Metrology (China)
Zhi-feng Wu, National Institute of Metrology (China)
Xiao-jin Qi, National Institute of Metrology (China)
Jing Ye, National Institute of Metrology (China)
Bin-hua Chen, National Institute of Metrology (China)
Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 8910:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications
Lifu Zhang; Jianfeng Yang, Editor(s)

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