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Proceedings Paper

High resolution, high bandwidth global shutter CMOS area scan sensors
Author(s): Naser Faramarzpour; Matthias Sonder; Binqiao Li
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Paper Abstract

Global shuttering, sometimes also known as electronic shuttering, enables the use of CMOS sensors in a vast range of applications. Teledyne DALSA Global shutter sensors are able to integrate light synchronously across millions of pixels with microsecond accuracy. Teledyne DALSA offers 5 transistor global shutter pixels in variety of resolutions, pitches and noise and full-well combinations. One of the recent generations of these pixels is implemented in 12 mega pixel area scan device at 6 um pitch and that images up to 70 frames per second with 58 dB dynamic range. These square pixels include microlens and optional color filters. These sensors also offer exposure control, anti-blooming and high dynamic range operation by introduction of a drain and a PPD reset gate to the pixel. The state of the art sense node design of Teledyne DALSA’s 5T pixel offers exceptional shutter rejection ratio. The architecture is consistent with the requirements to use stitching to achieve very large area scan devices. Parallel or serial digital output is provided on these sensors using on-chip, column-wise analog to digital converters. Flexible ADC bit depth combined with windowing (adjustable region of interest, ROI) allows these sensors to run with variety of resolution/bandwidth combinations. The low power, state of the art LVDS I/O technology allows for overall power consumptions of less than 2W at full performance conditions.

Paper Details

Date Published: 24 October 2013
PDF: 6 pages
Proc. SPIE 8889, Sensors, Systems, and Next-Generation Satellites XVII, 88891E (24 October 2013); doi: 10.1117/12.2030682
Show Author Affiliations
Naser Faramarzpour, Teledyne Dalsa Inc. (Canada)
Matthias Sonder, Teledyne Dalsa Inc. (Canada)
Binqiao Li, Teledyne Dalsa Inc. (Canada)


Published in SPIE Proceedings Vol. 8889:
Sensors, Systems, and Next-Generation Satellites XVII
Roland Meynart; Steven P. Neeck; Haruhisa Shimoda, Editor(s)

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