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Proceedings Paper

Long-term lumen depreciation behavior and failure modes of multi-die array LEDs
Author(s): Asiri Jayawardena; Daniel Marcus; Ximena Prugue; Nadarajah Narendran
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Paper Abstract

One of the main advantages of multi-die array light-emitting diodes (LEDs) is their high flux density. However, a challenge for using such a product in lighting fixture applications is the heat density and the need for thermal management to keep the junction temperatures of all the dies low for long-term reliable performance. Ten multi-die LED array samples for each product from four different manufacturers were subjected to lumen maintenance testing (as described in IES-LM-80-08), and their resulting lumen depreciation and failure modes were studied. The products were tested at the maximum case (or pin) temperature reported by the respective manufacturer by appropriately powering the LEDs. In addition, three samples for each product from two different manufacturers were subjected to rapid thermal cycling, and the resulting lumen depreciation and failure modes were studied. The results showed that the exponential lumen decay model using long-term lumen maintenance data as recommended in IES TM-21 does not fit for all package types. The failure of a string of dies and single die failure in a string were observed in some of the packages.

Paper Details

Date Published: 30 September 2013
PDF: 7 pages
Proc. SPIE 8835, LED-based Illumination Systems, 883510 (30 September 2013); doi: 10.1117/12.2030671
Show Author Affiliations
Asiri Jayawardena, Rensselaer Polytechnic Institute (United States)
Daniel Marcus, Rensselaer Polytechnic Institute (United States)
Ximena Prugue, Rensselaer Polytechnic Institute (United States)
Nadarajah Narendran, Rensselaer Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 8835:
LED-based Illumination Systems
Jianzhong Jiao, Editor(s)

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