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Proceedings Paper

Fabric defect detection based on annular Gaussian band-pass filters
Author(s): Runping Han; Jianxia Su
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Paper Abstract

A new method for fabric defect detection is proposed. It is based on the filter group containing four annular Gaussian band-pass filters and aimed at detecting defects in fabrics with plain and twill structures. A fabric sample image is processed by using this filter group and the filtered images are obtained. These filtered images are binarized and fused in order to reconstruct the defect binary image that distinguishes defects from texture background. In the performance evaluation and comparison experiments, this method is applied to a variety of fabrics with various defects. Experiment results have confirmed this method has good real time performance and is effective in fabric defect detection.

Paper Details

Date Published: 19 July 2013
PDF: 5 pages
Proc. SPIE 8878, Fifth International Conference on Digital Image Processing (ICDIP 2013), 88782N (19 July 2013); doi: 10.1117/12.2030623
Show Author Affiliations
Runping Han, Beijing Institute of Fashion Technology (China)
Jianxia Su, Beijing Institute of Fashion Technology (China)


Published in SPIE Proceedings Vol. 8878:
Fifth International Conference on Digital Image Processing (ICDIP 2013)
Yulin Wang; Xie Yi, Editor(s)

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