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Proceedings Paper

Image parameters for maturity determination of a composted material containing sewage sludge
Author(s): S. Kujawa; K. Nowakowski; R. J. Tomczak; P. Boniecki; J. Dach
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Paper Abstract

Composting is one of the best methods for management of sewage sludge. In a reasonably conducted composting process it is important to early identify the moment in which a material reaches the young compost stage. The objective of this study was to determine parameters contained in images of composted material’s samples that can be used for evaluation of the degree of compost maturity. The study focused on two types of compost: containing sewage sludge with corn straw and sewage sludge with rapeseed straw. The photographing of the samples was carried out on a prepared stand for the image acquisition using VIS, UV-A and mixed (VIS + UV-A) light. In the case of UV-A light, three values of the exposure time were assumed. The values of 46 parameters were estimated for each of the images extracted from the photographs of the composted material’s samples. Exemplary averaged values of selected parameters obtained from the images of the composted material in the following sampling days were presented. All of the parameters obtained from the composted material’s images are the basis for preparation of training, validation and test data sets necessary in development of neural models for classification of the young compost stage.

Paper Details

Date Published: 19 July 2013
PDF: 5 pages
Proc. SPIE 8878, Fifth International Conference on Digital Image Processing (ICDIP 2013), 88782K (19 July 2013); doi: 10.1117/12.2030563
Show Author Affiliations
S. Kujawa, Poznan Univ. of Life Sciences (Poland)
K. Nowakowski, Poznan Univ. of Life Sciences (Poland)
R. J. Tomczak, Poznan Univ. of Life Sciences (Poland)
P. Boniecki, Poznan Univ. of Life Sciences (Poland)
J. Dach, Poznan Univ. of Life Sciences (Poland)


Published in SPIE Proceedings Vol. 8878:
Fifth International Conference on Digital Image Processing (ICDIP 2013)
Yulin Wang; Xie Yi, Editor(s)

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