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Proceedings Paper

Refractive index of thin films realized by Satisloh SP reactive sputtering system
Author(s): Gianni Monaco; Arturo Colautti; Cristina Allegro; Tom Godin; Steffan Gold; Michael Witzany
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Paper Abstract

Pulsed DC reactive sputtering is a very interesting technique for coating applications. Reactive sputtering can give very dense layers, low stress of the deposited multilayer film, high reproducibility, very high hardness (up to 1200 Vickers hardness) with unbeatable high rates ideal for industrial applications. SP-100 is Satisloh reactive sputtering systems with only one target material but can deposit various film materials simply by using different gases such as argon, as well as the reactive gases nitrogen and oxygen. Silicon-oxides, silicon-nitrides and all kinds of silicon-oxy-nitrides (SiOx-SixOyNz-SixNy) with a refractive index range of 1.44-2.05 in the visible range can be obtained. In the reactive sputtering the material it is usually deposited in the so called “transition mode” where it must be found the correct equilibrium point between the target voltage and the reactive gas flow. The transition mode assures a dense film with a stable rate. Condition to find such equilibrium point is given by the so called “material hysteresis” in which the target voltage is depicted in function of the reactive gas voltage. The hysteresis and the consequent equilibrium point are strongly depended by the power supplied to the target and the inert gas (argon) flow which could affect the optical characteristics and the deposition rate. We checked the refractive indexes of the SiOx and SixNy of very thin (1 QW Optical thickness at 520 nm) and thicker (3, 5 and 9 QW @520 nm) reporting how the different conditions can affect the refractive index and the deposition rate of the different materials.

Paper Details

Date Published: 15 October 2013
PDF: 7 pages
Proc. SPIE 8884, Optifab 2013, 88841B (15 October 2013); doi: 10.1117/12.2030474
Show Author Affiliations
Gianni Monaco, Satisloh Italy S.r.l. (Italy)
Arturo Colautti, Satisloh Italy S.r.l. (Italy)
Cristina Allegro, Satisloh Italy S.r.l. (Italy)
Tom Godin, Satisloh North America Inc. (United States)
Steffan Gold, Satisloh GmbH (Germany)
Michael Witzany, Satisloh Italy S.r.l. (Italy)
Satisloh GmbH (Germany)


Published in SPIE Proceedings Vol. 8884:
Optifab 2013
Julie L. Bentley; Matthias Pfaff, Editor(s)

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