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Proceedings Paper

Criteria for lipid layer pattern evaluation: Pli-marker database
Author(s): Carlos García-Resúa; Hugo Pena-Verdeal; Beatriz Remeseiro; Manuel G. Penedo; María Jesús Giráldez; Eva Yebra-Pimentel
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Paper Abstract

The purpose of this study is to establish the procedure of acquisition and evaluate the Lipid layer pattern (LLP) by Tearscope in order to enhance this useful technique. To aid this purpose, we present a new broad LLP images database (included in a web application called Pli-marker) The tear film lipid layer was examined using a Tearscope-plus (Keeler, Windsor, UK). To capture LLPs videos a Topcon DV-3 digital camera was used and attached to the slit lamp. All videos were stored in a computer via Topcon IMAGEnet i-base software and LLP images were obtained and uploaded at Pli-marker web application, which offers the manual selection of regions associated to a specific LLP. 50 images were analysed by 4 experienced optometrists. Each of them marked (using Pli-marker) those areas in the 50 images that corresponded with some of the 5 LLP: open meshwork (OM), closed meshwork, (CM), wave (W), amorphous (AM) and color fringe (CO). From the 50 images we obtained 25 areas of OM, 22 areas of CM, 20 areas of W, 46 areas of AM and 17 areas of CO that 4 observers were in accordance. We present an example of 4 pictures for each area of concordance together with the description of the features used for categorizing the LLP in our study. This work describes the methodology used in our research project, including settings for capture image, and the criteria for subjective categorization of the LLP accomplished by a set of images.

Paper Details

Date Published: 18 November 2013
PDF: 8 pages
Proc. SPIE 8785, 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications, 8785EU (18 November 2013); doi: 10.1117/12.2030429
Show Author Affiliations
Carlos García-Resúa, Univ. de Santiago de Compostela (Spain)
Hugo Pena-Verdeal, Univ. de Santiago de Compostela (Spain)
Beatriz Remeseiro, Univ. of A Coruña (Spain)
Manuel G. Penedo, Univ. of A Coruña (Spain)
María Jesús Giráldez, Univ. de Santiago de Compostela (Spain)
Eva Yebra-Pimentel, Univ. de Santiago de Compostela (Spain)


Published in SPIE Proceedings Vol. 8785:
8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications
Manuel Filipe P. C. Martins Costa, Editor(s)

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