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Proceedings Paper

Photovoltaic reliability engineering: quantification testing and probabilistic-design-reliability concept
Author(s): Ephraim Suhir; Laurent Bechou; Alain Bensoussan; Johann Nicolics
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Paper Abstract

Qualification testing (QT) is the major means for making a viable photovoltaic (PV) device into a reliable and marketable product. It is well known, however, that the today’s PV modules (PVM) that passed the existing QT often exhibit premature field failures. Could the existing QT specifications and testing procedures be improved to an extent that if a PV device, module or a system passed the QT, there is a quantifiable and consistent way to assure that its performance in the field will be satisfactory and that its projected lifetime will indeed take place with the given confidence? The application of the probabilistic design for reliability (PDfR) concept enables one to provide an affirmative answer to this question. The attributes and challenges of this concept and the roles of its major constituents - failure oriented accelerated testing (FOAT) and physically meaningful predictive modeling (PM) - are addressed and discussed in detail.

Paper Details

Date Published: 24 September 2013
PDF: 14 pages
Proc. SPIE 8825, Reliability of Photovoltaic Cells, Modules, Components, and Systems VI, 88250K (24 September 2013); doi: 10.1117/12.2030377
Show Author Affiliations
Ephraim Suhir, ERS Co. (United States)
Technische Univ. Wien (Austria)
Laurent Bechou, Lab. IMS, CNRS, Univ. Bordeaux 1 (France)
Alain Bensoussan, Thales Alenia Space (France)
Johann Nicolics, Technische Univ. Wien (Austria)

Published in SPIE Proceedings Vol. 8825:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VI
Neelkanth G. Dhere; John H. Wohlgemuth; Kevin W. Lynn, Editor(s)

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