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Proceedings Paper

Understanding the physical and material dynamics of multipulse femtosecond laser interactions with surfaces
Author(s): Troy P. Anderson; Craig Zuhlke; Chris Wilson; Corey Kruse; Natale Ianno; Sidy Ndao; George Gogos; Dennis Alexander
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Paper Abstract

We describe the evolution of laser damage spots on bulk nickel generated by multipulse femtosecond laser irradiation with a 100 μm x 100 μm square flat-top beam profile as a function of the laser fluence and the number of pulses incident on the target. This large-area irradiation simulates conditions associated with the interaction of femtosecond laser pulses on a remote target. The larger area laser damage sites are characterized either by a series of self-organized surface structures with micro- and nanoscale features or a deep circular pit rather than a crater that mirrors the beam profile. Furthermore, the ablation rate of the deepest feature sharply increases above a laser fluence of 2 J/cm2; this increase is associated with the creation of a deep circular ablation pit generated during ablation with the first few pulses on the sample that continuously grows upon multipulse irradiation due to the focusing of incident laser energy into the pit by the sloped pit surfaces.

Paper Details

Date Published: 14 November 2013
PDF: 8 pages
Proc. SPIE 8885, Laser-Induced Damage in Optical Materials: 2013, 888518 (14 November 2013); doi: 10.1117/12.2030319
Show Author Affiliations
Troy P. Anderson, Univ. of Nebraska-Lincoln (United States)
Craig Zuhlke, Univ. of Nebraska-Lincoln (United States)
Chris Wilson, Univ. of Nebraska-Lincoln (United States)
Corey Kruse, Univ. of Nebraska-Lincoln (United States)
Natale Ianno, Univ. of Nebraska-Lincoln (United States)
Sidy Ndao, Univ. of Nebraska-Lincoln (United States)
George Gogos, Univ. of Nebraska-Lincoln (United States)
Dennis Alexander, Univ. of Nebraska-Lincoln (United States)


Published in SPIE Proceedings Vol. 8885:
Laser-Induced Damage in Optical Materials: 2013
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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