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Proceedings Paper

Properties of cathodoluminescence for cryogenic applications of SiO2-based space observatory optics and coatings
Author(s): Amberly Evans Jensen; J.R. Dennison; Gregory Wilson; Justin Dekany; Charles W. Bowers; Robert Meloy; James B. Heaney
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Paper Abstract

Disordered thin film SiO2/SiOx coatings undergoing electron-beam bombardment exhibit cathodoluminescence, which can produce deleterious stray background light in cryogenic space-based astronomical observatories exposed to high energy electron fluxes from space plasmas. As future observatory missions push the envelope into more extreme environments and more complex and sensitive detection, a fundamental understanding of the dependencies of this cathodoluminescence becomes critical to meet performance objectives of these advanced space-based observatories. Measurements of absolute radiance and emission spectra as functions of incident electron energy, flux, and power typical of space environments are presented for thin (~60-200 nm) SiO2/SiOx optical coatings on reflective metal substrates over a range of sample temperatures (~40-400 K) and emission wavelengths (~260-5000 nm). Luminescent intensity and peak wavelengths of four distinct bands were observed in UV/VIS/NIR emission spectra, ranging from 300 nm to 1000 nm. A simple model is proposed that describes the dependence of cathodoluminescence on irradiation time, incident flux and energy, sample thickness, and temperature.

Paper Details

Date Published: 27 September 2013
PDF: 10 pages
Proc. SPIE 8863, Cryogenic Optical Systems and Instruments 2013, 88630A (27 September 2013); doi: 10.1117/12.2030231
Show Author Affiliations
Amberly Evans Jensen, Utah State Univ. (United States)
J.R. Dennison, Utah State Univ. (United States)
Gregory Wilson, Utah State Univ. (United States)
Justin Dekany, Utah State Univ. (United States)
Charles W. Bowers, NASA Goddard Space Flight Ctr. (United States)
Robert Meloy, MEI Technologies, Inc. (United States)
James B. Heaney, Stinger Ghaffarian Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 8863:
Cryogenic Optical Systems and Instruments 2013
James B. Heaney; E. Todd Kvamme, Editor(s)

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