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Proceedings Paper

Modeling femtosecond pulse laser damage on conductors using Particle-In-Cell simulations
Author(s): Robert A. Mitchell; Douglass Schumacher; Enam Chowdhury
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Paper Abstract

We present, to our knowledge, the first adaptation of the Particle-In-Cell (PIC) simulation method for use in the study of femtosecond pulse laser damage, including the first implementation of the Morse potential for PIC codes. We compare the PIC method to a wide variety of currently used modeling schemes, ranging from purely ab-initio molecular dynamics simulations to semi-empirical models with many fitting parameters, and show how PIC simulations can provide a complementary approach by filling the gap in theoretical methodology between the two cases. We detail the necessity and implementation of an inter-atomic pair-potential in PIC studies of laser damage. Lastly, we use our model to treat the full laser damage process of a copper target, and show that our results compare well to simple scaling laws for crater size.

Paper Details

Date Published: 14 November 2013
PDF: 7 pages
Proc. SPIE 8885, Laser-Induced Damage in Optical Materials: 2013, 88851U (14 November 2013); doi: 10.1117/12.2030229
Show Author Affiliations
Robert A. Mitchell, The Ohio State Univ. (United States)
Douglass Schumacher, The Ohio State Univ. (United States)
Enam Chowdhury, The Ohio State Univ. (United States)


Published in SPIE Proceedings Vol. 8885:
Laser-Induced Damage in Optical Materials: 2013
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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