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Proceedings Paper

Broadband THz detection and homodyne mixing using GaAs high-electron-mobility transistor rectifiers
Author(s): S. Preu; S. Regensburger; S. Kim; M. Mittendorff; S. Winnerl; S. Malzer; H. Lu; P. G. Burke; A. C. Gossard; H. B. Weber; M. S. Sherwin
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Paper Abstract

We report on Terahertz (THz) detectors based on III-V high-electron-mobility field-effect transistors (FET). The detection results from a rectification process that is still highly efficient far above frequencies where the transistor provides gain. Several detector layouts have been optimized for specific applications at room temperature: we show a broadband detector layout, where the rectifying FET is coupled to a broadband logarithmic-periodic antenna. Another layout is optimized for mixing of two orthogonal THz beams at 370 GHz or, alternatively, 570 GHz. A third version uses a large array of FETs with very low access resistance allowing for detection of very short high-power THz pulses. We reached a time resolution of 20 ps.

Paper Details

Date Published: 18 October 2013
PDF: 9 pages
Proc. SPIE 8900, Millimetre Wave and Terahertz Sensors and Technology VI, 89000R (18 October 2013); doi: 10.1117/12.2029478
Show Author Affiliations
S. Preu, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
S. Regensburger, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
S. Kim, Tanner Research, Inc. (United States)
M. Mittendorff, Helmholtz-Zentrum Dresden-Rossendorf e. V. (Germany)
S. Winnerl, Helmholtz-Zentrum Dresden-Rossendorf e. V. (Germany)
S. Malzer, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
H. Lu, Univ. of California, Santa Barbara (United States)
P. G. Burke, Univ. of California, Santa Barbara (United States)
A. C. Gossard, Univ. of California, Santa Barbara (United States)
H. B. Weber, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
M. S. Sherwin, Univ. of California, Santa Barbara (United States)


Published in SPIE Proceedings Vol. 8900:
Millimetre Wave and Terahertz Sensors and Technology VI
Neil Anthony Salmon; Eddie L. Jacobs, Editor(s)

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