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Proceedings Paper

Effects of varying machine stiffness and contact area in UltraForm Finishing
Author(s): Dennis E. Briggs; Samantha Echaves; Brendan Pidgeon; Nathan Travis; Jonathan D. Ellis
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Paper Abstract

UltraForm Finishing (UFF) is a deterministic, subaperture, computer numerically controlled, grinding and polishing platform designed by OptiPro Systems. UFF is used to grind and polish a variety optics from simple spherical to fully freeform, and numerous materials from glasses to optical ceramics. The UFF system consists of an abrasive belt around a compliant wheel that rotates and contacts the part to remove material. This work aims to measure the stiffness variations in the system and how it can affect material removal rates. The stiffness of the entire system is evaluated using a triaxial load cell to measure forces and a capacitance sensor to measure deviations in height. Because the wheel is conformal and elastic, the shapes of contact areas are also of interest. For the scope of this work, the shape of the contact area is estimated via removal spot. The measured forces and removal spot area are directly related to material removal rate through Preston’s equation. Using our current testing apparatus, we will demonstrate stiffness measurements and contact areas for a single UFF belt during different states of its lifecycle and assess the material removal function from spot diagrams as a function of wear. This investigation will ultimately allow us to make better estimates of Preston’s coefficient and develop spot-morphing models in an effort to more accurately predict instantaneous material removal functions throughout the lifetime of a belt.

Paper Details

Date Published: 15 October 2013
PDF: 6 pages
Proc. SPIE 8884, Optifab 2013, 888405 (15 October 2013); doi: 10.1117/12.2029369
Show Author Affiliations
Dennis E. Briggs, Univ. of Rochester (United States)
Samantha Echaves, Univ. of Rochester (United States)
Brendan Pidgeon, Univ. of Rochester (United States)
Nathan Travis, Univ. of Rochester (United States)
Jonathan D. Ellis, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 8884:
Optifab 2013
Julie L. Bentley; Matthias Pfaff, Editor(s)

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