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Proceedings Paper

Responsivity mapping techniques for the non-positional CCD: the swept charge device CCD236
Author(s): P. H. Smith; N. J. Murray; C. MacCormick; J. P. D. Gow; D. Weatherill; E. Allanwood; P. Pool; A. D. Holland
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Paper Abstract

The e2v CCD236 is a swept charge device (SCD) designed as a soft X-ray detector for spectroscopy in the range 0.8 keV to 10 keV [1]. It benefits from improvements in design over the previous generation of SCD (the e2v CCD54) [2] to allow for increased detector area, a reduction in split X-ray events and improvements to radiation hardness [3]. To enable the suppression of surface dark current the device is clocked continuously, therefore there is no positional information making responsivity variations difficult to measure. This paper describes investigated techniques to achieve a responsivity map across the device using masking and XRF, and spot illumination from an organic light-emitting diode (OLED). The results of this technique should allow a deeper understanding of the device sensitivity and allow better data interpretation in SCD applications.

Paper Details

Date Published: 26 September 2013
PDF: 11 pages
Proc. SPIE 8859, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII, 88590M (26 September 2013); doi: 10.1117/12.2028865
Show Author Affiliations
P. H. Smith, The Open Univ. (United Kingdom)
N. J. Murray, The Open Univ. (United Kingdom)
C. MacCormick, The Open Univ. (United Kingdom)
J. P. D. Gow, The Open Univ. (United Kingdom)
D. Weatherill, The Open Univ. (United Kingdom)
E. Allanwood, The Open Univ. (United Kingdom)
P. Pool, e2v technologies plc (United Kingdom)
A. D. Holland, The Open Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 8859:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII
Oswald H. Siegmund, Editor(s)

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