Share Email Print

Proceedings Paper

Comparison of alignment errors in asphere metrology between an interferometric null-test measurement and a non-null measurement with the tilted-wave-interferometer
Author(s): Goran Baer; Johannes Schindler; Christof Pruss; Wolfgang Osten
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In interferometric testing of surfaces a major task is to avoid the introduction of aberrations due to misalignment of the surface under test (SUT). An automated method for the positioning of aspheric and free-form surfaces in a non-null test interferometer, as well as a method for the distinction between alignment introduced aberrations and surface errors is presented. A combination of both methods allows for a fully automated alignment with low accuracy requirements concerning the positioning stage. In this work the method for the alignment as well as the alignment error correction is presented and the misalignment introduced measurement uncertainties are estimated. Simulation results as well as experimental results showing the feasibility of the method are presented.

Paper Details

Date Published: 15 October 2013
PDF: 7 pages
Proc. SPIE 8884, Optifab 2013, 88840T (15 October 2013); doi: 10.1117/12.2028756
Show Author Affiliations
Goran Baer, Univ. Stuttgart (Germany)
Johannes Schindler, Univ. Stuttgart (Germany)
Christof Pruss, Univ. Stuttgart (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 8884:
Optifab 2013
Julie L. Bentley; Matthias Pfaff, Editor(s)

© SPIE. Terms of Use
Back to Top