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Proceedings Paper

Snapshot imaging Mueller matrix instrument
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Paper Abstract

A novel way to measure the Mueller matrix image enables a sample's diattenuation, retardance, and depolarization to be measured within a single camera integration period. Since the Mueller matrix components are modulated onto coincident carrier frequencies, the described technique provides unique solutions to image registration problems for moving objects. In this paper, a snapshot imaging Mueller matrix polarimeter is theoretically described, and preliminary results shows it to be a viable approach for use in surface characterization of moving objects.

Paper Details

Date Published: 22 October 2013
PDF: 6 pages
Proc. SPIE 8897, Electro-Optical Remote Sensing, Photonic Technologies, and Applications VII; and Military Applications in Hyperspectral Imaging and High Spatial Resolution Sensing, 88970S (22 October 2013); doi: 10.1117/12.2028546
Show Author Affiliations
Michael W. Kudenov, North Carolina State Univ. (United States)
Sushmit Mallik, North Carolina State Univ. (United States)
Michael J. Escuti, North Carolina State Univ. (United States)
Nathan Hagen, Rebellion Photonics (United States)
Kazuhiko Oka, Hokkaido Univ. (Japan)
Eustace L. Dereniak, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 8897:
Electro-Optical Remote Sensing, Photonic Technologies, and Applications VII; and Military Applications in Hyperspectral Imaging and High Spatial Resolution Sensing
Gary W. Kamerman; Gary J. Bishop; John D. Gonglewski; Ove K. Steinvall, Editor(s)

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