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Proceedings Paper

Ammonia detection using optical reflectance from porous silicon formed by metal-assisted chemical etching
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Paper Abstract

An impact of morphology on reflectance of porous silicon was investigated. Depending on the metal-assisted chemical etching conditions the macro- micro structures could be formed. The reflectance properties of various porous silicon structures after ammonia adsorption were investigated. It was shown that increasing of ammonia concentration in the measurement camber leads to an increase of the reflectance. The most sensitive structures for ammonia detection are porous silicon having approximately size of pores - 10-15 μm. A fast response of porous silicon on the adsorption of ammonia molecules may be used for development of new sensors.

Paper Details

Date Published: 16 October 2013
PDF: 6 pages
Proc. SPIE 8901, Optics and Photonics for Counterterrorism, Crime Fighting and Defence IX; and Optical Materials and Biomaterials in Security and Defence Systems Technology X, 89010K (16 October 2013); doi: 10.1117/12.2028497
Show Author Affiliations
Igor Iatsunskyi, Odessa I.I. Mechnikov National Univ. (Ukraine)
Valentyn Smyntyna, Odessa I.I. Mechnikov National Univ. (Ukraine)
Mykolai Pavlenko, Odessa I.I. Mechnikov National Univ. (Ukraine)
Olga Kanevska, Odessa I.I. Mechnikov National Univ. (Ukraine)
Yuliia Kirik, Odessa I.I. Mechnikov National Univ. (Ukraine)
Valeryi Myndrul, Odessa I.I. Mechnikov National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 8901:
Optics and Photonics for Counterterrorism, Crime Fighting and Defence IX; and Optical Materials and Biomaterials in Security and Defence Systems Technology X
Roberto Zamboni; Douglas Burgess; Gari Owen; Francois Kajzar; Attila A. Szep, Editor(s)

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