Share Email Print

Proceedings Paper

Ellipsometric study of the growing crystal face
Author(s): Andrew Y. Tronin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The growing face of LIJO3 crystal was studied by means of ellipsometry and interferometry . izi situ. Two phenomena were observed: the existence of solution boundary layer adjacent to the growing face and the formation of zonar defect structure of the crystal. The thickness of the boundary layer is estimated to be about 50 nm. Refraction index of the layer is 0. 02 higher than that of the bulk solution. The formation of zonar structure was observed in the form of spontaneous inclusion of quasi-two-dimensional layers in the growing crystal. Mean distance between them was estimated to be 10 aim. 2 .

Paper Details

Date Published: 1 August 1990
PDF: 8 pages
Proc. SPIE 1266, In-Process Optical Measurements and Industrial Methods, (1 August 1990); doi: 10.1117/12.20280
Show Author Affiliations
Andrew Y. Tronin, Institute of Crystallography (Russia)

Published in SPIE Proceedings Vol. 1266:
In-Process Optical Measurements and Industrial Methods
H. A. Macleod; Peter Langenbeck, Editor(s)

© SPIE. Terms of Use
Back to Top