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Proceedings Paper

Indexing damage using distortion of embedded FBG sensor response spectra
Author(s): Gayan C. Kahandawa; Jayantha A. Epaarachchi; K. T. Lau
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Paper Abstract

Structural Health Monitoring Systems based on embedded FBG sensors, to identify damage conditions, are largely dependent on the spectral distortion of the sensors. The uneven stress gradient occurring along the grating of FBG sensors, due to damage inside composite structures can be estimated by analysing significant changes that appear in the FBG response spectra. However, the stochastic nature of the distorted shape of the FBG spectra makes it difficult to interpret and quantify the existing damage at the location of the FBG sensors. There are several indexing methods proposed by researchers. We have previously presented a novel concept of the “Distortion Index (DI)” which is defined using distorted spectra of FBG sensors. It was observed that the DI increases with the increase in damage size. The Distortion Index (DI) is introduced to create a correlation between the damage and the distortion of the response spectra of a FBG sensor. This index provides the ability to generalise the distortion of FBG spectra for a particular structure. The index can be used to quantify the damage in the structure relative to its original condition, which can be the condition of structure during a regulated time, i.e. a month uninterrupted operation or first hours in operation, of a structure can be used as no damage condition. In this paper we discuss the application of distortion index and comparison with available several other indexes.

Paper Details

Date Published: 14 August 2013
PDF: 6 pages
Proc. SPIE 8793, Fourth International Conference on Smart Materials and Nanotechnology in Engineering, 87930K (14 August 2013); doi: 10.1117/12.2027945
Show Author Affiliations
Gayan C. Kahandawa, Univ. of Southern Queensland (Australia)
Jayantha A. Epaarachchi, Univ. of Southern Queensland (Australia)
K. T. Lau, The Hong Kong Polytechnic Univ. (Hong Kong, China)


Published in SPIE Proceedings Vol. 8793:
Fourth International Conference on Smart Materials and Nanotechnology in Engineering
Jayantha A. Epaarachchi; Alan Kin-tak Lau; Jinsong Leng, Editor(s)

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