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Proceedings Paper

Measurement of surface quality using a moire deflectometer
Author(s): Eliezer Keren; Kathi Kreske; Amiadav Livnat
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Paper Details

Date Published: 1 August 1990
PDF: 8 pages
Proc. SPIE 1266, In-Process Optical Measurements and Industrial Methods, (1 August 1990); doi: 10.1117/12.20279
Show Author Affiliations
Eliezer Keren, Rotlex Optics Ltd. (Israel)
Kathi Kreske, Rotlex Optics Ltd. (Israel)
Amiadav Livnat, Rotlex Optics Ltd. (Israel)


Published in SPIE Proceedings Vol. 1266:
In-Process Optical Measurements and Industrial Methods
H. A. Macleod; Peter Langenbeck, Editor(s)

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