Share Email Print
cover

Proceedings Paper

Influence of the ultraviolet irradiation on the properties of TiO2-polystyrene shape memory nanocomposites
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

To date, majority shape adaptations of shape memory polymer (SMP) are thermo responsive. A desire for isothermal, remotely controlled shape adaptations of SMP has motivated examinations of other stimulus. We successfully construct novel TiO2-polystyrene shape memory nanocomposites and investigate influence of the ultraviolet irradiation on the shape memory effect. This material is facilely fabricated by introducing TiO2 into polystyrene SMP. The properties of TiO2-polystyrene shape memory nanocomposites are characterized by X-ray powder diffraction (XRD), Fourier transform infrared spectra (FT-IR), dynamic mechanical analysis (DMA), and diffused reflectance spectrum (DRS). Deriving from photoelectric foundational properties of TiO2, the TiO2-polystyrene shape memory nanocomposites can absorb light energy and undergo intra-molecular or inter-molecular physical or chemical transformations. Furthermore, the results of this work provide a useful baseline upon which researchers could explore more interesting behaviors of photosensitive SMP composite and investigate other more challenging actuation problems.

Paper Details

Date Published: 9 August 2013
PDF: 8 pages
Proc. SPIE 8793, Fourth International Conference on Smart Materials and Nanotechnology in Engineering, 879315 (9 August 2013); doi: 10.1117/12.2027860
Show Author Affiliations
Wenxin Wang, Harbin Institute of Technology (China)
Yanju Liu, Harbin Institute of Technology (China)
Jinsong Leng, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 8793:
Fourth International Conference on Smart Materials and Nanotechnology in Engineering
Jayantha A. Epaarachchi; Alan Kin-tak Lau; Jinsong Leng, Editor(s)

© SPIE. Terms of Use
Back to Top