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Proceedings Paper

Data analysis for x-ray fluorescence microscopy: unique challenges and opportunities
Author(s): Stefan Vogt; Siwei Wang; Jesse Ward; Stefan Wild; Martin de Jonge; Barry Lai; Sven Leyffer; Chris Jacobsen
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Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510N; doi: 10.1117/12.2027287
Show Author Affiliations
Stefan Vogt, Argonne National Lab. (United States)
Siwei Wang, Argonne National Lab. (United States)
Jesse Ward, Argonne National Lab. (United States)
Stefan Wild, Argonne National Lab. (United States)
Martin de Jonge, Australian Synchrotron (Australia)
Barry Lai, Argonne National Lab. (United States)
Sven Leyffer, Argonne National Lab. (United States)
Chris Jacobsen, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 8851:
X-Ray Nanoimaging: Instruments and Methods
Barry Lai, Editor(s)

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