Share Email Print

Proceedings Paper

Microprofilometry using a spatial carrier frequency interferometrical technique
Author(s): Gottfried Frankowski; Frank Schillke
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published: 1 August 1990
PDF: 12 pages
Proc. SPIE 1266, In-Process Optical Measurements and Industrial Methods, (1 August 1990); doi: 10.1117/12.20272
Show Author Affiliations
Gottfried Frankowski, Institute of Automation (Germany)
Frank Schillke, Institute of Automation (Germany)

Published in SPIE Proceedings Vol. 1266:
In-Process Optical Measurements and Industrial Methods
H. A. Macleod; Peter Langenbeck, Editor(s)

© SPIE. Terms of Use
Back to Top