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Proceedings Paper

Optimized cavity-enhanced x-ray sources for x-ray microscopy
Author(s): J. M. J. Madey; E. B. Szarmes; M. R. Hadmack; B. T. Jacobson; J. M. D. Kowalczyk; P. Niknejadi
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Paper Abstract

It is now widely recognized that the intensity and brightness of inverse-Compton x-ray light sources can be enhanced through the use of a high finesse optical storage cavity. But the criteria for the practical use and optimization of such cavities are less well understood. We will review those criteria and their application to the development of an optimized high brightness 5 - 20 keV inverse-Compton x-ray source under development at the University of Hawai`i.

Paper Details

Date Published: 26 September 2013
PDF: 9 pages
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510W (26 September 2013); doi: 10.1117/12.2027193
Show Author Affiliations
J. M. J. Madey, Univ. of Hawai'i at Manoa (United States)
E. B. Szarmes, Univ. of Hawai'i at Manoa (United States)
M. R. Hadmack, Univ. of Hawai'i at Manoa (United States)
B. T. Jacobson, RadiaBeam Technologies, LLC (United States)
J. M. D. Kowalczyk, Univ. of Hawai'i at Manoa (United States)
P. Niknejadi, Univ. of Hawai'i at Manoa (United States)

Published in SPIE Proceedings Vol. 8851:
X-Ray Nanoimaging: Instruments and Methods
Barry Lai, Editor(s)

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