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Proceedings Paper

Study of 3D solder-paste profilometer by dual digital fringe projection
Author(s): Yi-Hua Juan; Jeng-Nan Yih; Nai-Jen Cheng
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Paper Abstract

In a 3D profilometer by the fringe projection, the shadow will be produced inevitably, thus the fringes cannot be detected in the region of the shadow. In addition, a smooth surface or a metal surface produces the specular reflection, and then, no projection fringe can be recorded in the region of oversaturation on CCD. This paper reveals a proposed system for improved these defects and shows some preliminary improved 3D profiles by the proposed dual fringe projection. To obtain the profile of sample hided in the shadow and the oversaturation, this study used the dual-projection system by two projectors. This system adopted two different directions of fringe projection and illuminates them alternately, therefore, the shadow and the oversaturation produced in their corresponding locations. Two raw 3D profiles obtained from taking the dual-projection by the four-step phase-shift. A set of algorithms used to identify the pixels of the shadow and the oversaturation, and create an error-map. According to the error-map to compensate, two 3D profiles merged into an error-reduced 3D profile. We used the solder paste as a testing sample. After comparatively analyzing the 3D images obtained by our measurement system and by a contact stylus profilometer, the result shows that our measurement system can effectively reduce the error caused by shadows and oversaturation. Fringe projection system by using a projector is a non-contact, full field and quickly measuring system. The proposed dual-projection by dual-projectors can effectively reduce the shadow and the oversaturation errors and enhance the scope of application of the 3D contour detection, especially in the detection of precision structure parts with specular reflection.

Paper Details

Date Published: 26 September 2013
PDF: 8 pages
Proc. SPIE 8856, Applications of Digital Image Processing XXXVI, 88562P (26 September 2013); doi: 10.1117/12.2027120
Show Author Affiliations
Yi-Hua Juan, National Kaohsiung Univ. of Applied Sciences (Taiwan, China)
Jeng-Nan Yih, National Kaohsiung Univ. of Applied Sciences (Taiwan, China)
Nai-Jen Cheng, National Kaohsiung Univ. of Applied Sciences (Taiwan, China)


Published in SPIE Proceedings Vol. 8856:
Applications of Digital Image Processing XXXVI
Andrew G. Tescher, Editor(s)

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