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Proceedings Paper

Growth and characterization of CdTeSe for room-temperature radiation detector applications
Author(s): U. N. Roy; A. E. Bolotnikov; G. S. Camarda; Y. Cui; A. Hossain; G. Yang; R. B. James; A. Fauler; M. Fiederle; M. Sowinska; G. Hennard; P. Siffert
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Paper Abstract

The near-unity segregation coefficient of Se in a CdTe matrix ensures the compositional homogeneity, both axial- and radial, of the CdTeSe ternary compound, so making it a material of choice for room- temperature radiation detectors. In this study, we grew CdTeSe crystals by the Traveling Heater Method (THM), using Te as the solvent, and characterized the crystals by IR transmission microscopy, white-beam X-ray diffraction topography, and low-temperature photoluminescence. The total average concentration of the secondary phases obtained for the CdTeSe sample was about 7x104 cm-3 for crystals grown at two different laboratories. The best resistivity registered was 5x109 ohm-cm, and the estimated μτ product for the electrons was 3-4x10-3 cm2/V.

Paper Details

Date Published: 26 September 2013
PDF: 4 pages
Proc. SPIE 8852, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV, 885210 (26 September 2013); doi: 10.1117/12.2027081
Show Author Affiliations
U. N. Roy, Brookhaven National Lab. (United States)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
G. S. Camarda, Brookhaven National Lab. (United States)
Y. Cui, Brookhaven National Lab. (United States)
A. Hossain, Brookhaven National Lab. (United States)
G. Yang, Brookhaven National Lab. (United States)
R. B. James, Brookhaven National Lab. (United States)
A. Fauler, Freiburger Materialforschungszentrum (Germany)
M. Fiederle, Freiburger Materialforschungszentrum (Germany)
M. Sowinska, Eurorad S.A. (France)
G. Hennard, Eurorad S.A. (France)
P. Siffert, Eurorad S.A. (France)

Published in SPIE Proceedings Vol. 8852:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV
Michael Fiederle; Arnold Burger; Larry Franks; Ralph B. James, Editor(s)

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