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Proceedings Paper

Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography
Author(s): Kadda Medjoubi; Alain Bonissent; Nicolas Leclercq; Florent Langlois; Pascal Mercère; Andrea Somogyi
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Paper Abstract

Scanning hard X-ray nanoprobe imaging provides a unique tool for probing specimens with high sensitivity and large penetration depth. Moreover, the combination of complementary techniques such as X-ray fluorescence, absorption, phase contrast and dark field imaging gives complete quantitative information on the sample structure, composition and chemistry. The multi-technique “FLYSCAN” data acquisition scheme developed at Synchrotron SOLEIL permits to perform fast continuous scanning imaging and as such makes scanning tomography techniques feasible in a time-frame well-adapted to typical user experiments. Here we present the recent results of simultaneous fast scanning multi-technique tomography performed at Soleil. This fast scanning scheme will be implemented at the Nanoscopium beamline for large field of view 2D and 3D multimodal imaging.

Paper Details

Date Published: 26 September 2013
PDF: 7 pages
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 88510P (26 September 2013); doi: 10.1117/12.2026680
Show Author Affiliations
Kadda Medjoubi, Synchrotron SOLEIL (France)
Alain Bonissent, Ctr. de Physique des Particules de Marseille (France)
CNRS/IN2P3 (France)
Nicolas Leclercq, Synchrotron SOLEIL (France)
Florent Langlois, Synchrotron SOLEIL (France)
Pascal Mercère, Synchrotron SOLEIL (France)
Andrea Somogyi, Synchrotron SOLEIL (France)


Published in SPIE Proceedings Vol. 8851:
X-Ray Nanoimaging: Instruments and Methods
Barry Lai, Editor(s)

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