Share Email Print
cover

Proceedings Paper

4D phase profile measurements using a single-shot phase shifting technique
Author(s): Noel-Ivan Toto-Arellano; A. Montes-Pérez; A. Martínez García; David Serrano-García; Luis R. Castelán Olvera; Jonathan Martínez Lozano; Anuar Jorge Muñoz
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, we propose a Quasi Common-Path Interferometer based on a two beams configuration using simultaneous phase shifting interferometry modulated by polarization. Due to the fact that the configuration is capable of obtaining two beams whose separation can be varied, according to the characteristics of the grid used, to obtain the interference patterns. It can be used to implement a quasi-common path interferometer that allows the measurement of dynamic events with high accuracy. For demodulate the fringe patterns generated by the optical system we using the conventional four step phase shifting method. Experimental results are also given.

Paper Details

Date Published: 15 October 2013
PDF: 6 pages
Proc. SPIE 8884, Optifab 2013, 888427 (15 October 2013); doi: 10.1117/12.2026483
Show Author Affiliations
Noel-Ivan Toto-Arellano, Univ. Tecnológica de Tulancingo (Mexico)
A. Montes-Pérez, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
A. Martínez García, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
David Serrano-García, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Luis R. Castelán Olvera, Univ. Tecnológica de Tulancingo (Mexico)
Jonathan Martínez Lozano, Univ. Tecnológica de Tulancingo (Mexico)
Anuar Jorge Muñoz, Univ. Tecnológica de Tulancingo (Mexico)


Published in SPIE Proceedings Vol. 8884:
Optifab 2013
Julie L. Bentley; Matthias Pfaff, Editor(s)

© SPIE. Terms of Use
Back to Top