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Proceedings Paper

A next-generation in-situ nanoprobe beamline for the Advanced Photon Source
Author(s): Jörg Maser; Barry Lai; Tonio Buonassisi; Zhonghou Cai; Si Chen; Lydia Finney; Sophie-Charlotte Gleber; Ross Harder; Chris Jacobsen; Wenjun Liu; Conal Murray; Curt Preissner; Chris Roehrig; Volker Rose; Deming Shu; David Vine; Stefan Vogt
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Paper Abstract

The Advanced Photon Source is currently developing a suite of new hard x-ray beamlines, aimed primarily at the study of materials and devices under real conditions. One of the flagship beamlines of the APS Upgrade is the In-Situ Nanoprobe beamline (ISN beamline), which will provide in-situ and operando characterization of advanced energy materials and devices under change of temperature and gases, under applied fields, in 3D. The ISN beamline is designed to deliver spatially coherent x-rays with photon energies between 4 keV and 30 keV to the ISN instrument. As an x-ray source, a revolver-type undulator with two interchangeable magnetic structures, optimized to provide high brilliance throughout the range of photon energies of 4 keV – 30 keV, will be used. The ISN instrument will provide a smallest hard x-ray spot of 20 nm using diffractive optics, with sensitivity to sub-10 nm sample structures using coherent diffraction. Using nanofocusing mirrors in Kirkpatrick-Baez geometry, the ISN will also provide a focus of 50 nm with a flux of 8·1011 Photons/s at a photon energy of 10 keV, several orders of magnitude larger than what is currently available. This will allow imaging of trace amounts of most elements in the periodic table, with a sensitivity to well below 100 atoms for most metals in thin samples. It will also enable nanospectroscopic studies of the chemical state of most materials relevant to energy science. The ISN beamline will be primarily used to study inorganic and organic photovoltaic systems, advanced batteries and fuel cells, nanoelectronics devices, and materials and systems diesigned to reduce the environmental impact of combustion.

Paper Details

Date Published: 26 September 2013
PDF: 6 pages
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885106 (26 September 2013); doi: 10.1117/12.2026418
Show Author Affiliations
Jörg Maser, Argonne National Lab. (United States)
Barry Lai, Argonne National Lab. (United States)
Tonio Buonassisi, Massachusetts Institute of Technology (United States)
Zhonghou Cai, Argonne National Lab. (United States)
Si Chen, Argonne National Lab. (United States)
Lydia Finney, Argonne National Lab. (United States)
Sophie-Charlotte Gleber, Argonne National Lab. (United States)
Ross Harder, Argonne National Lab. (United States)
Chris Jacobsen, Argonne National Lab. (United States)
Wenjun Liu, Argonne National Lab. (United States)
Conal Murray, IBM Thomas J. Watson Research Ctr. (United States)
Curt Preissner, Argonne National Lab. (United States)
Chris Roehrig, Argonne National Lab. (United States)
Volker Rose, Argonne National Lab. (United States)
Deming Shu, Argonne National Lab. (United States)
David Vine, Argonne National Lab. (United States)
Stefan Vogt, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 8851:
X-Ray Nanoimaging: Instruments and Methods
Barry Lai, Editor(s)

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