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Proceedings Paper

Analysis of impact of sintering temperature on microstructure of LSCF-SDC composite cathodes using nano-CT
Author(s): Yong Guan; Xin Pan; Gang Liu; Zhiting Liang; Shan Chen; Xiaobo Zhang; Ying Xiong; Yangchao Tian; Changrong Xia
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Paper Abstract

Composites of La0.4Sr0.6Co0.8Fe0.2O3−d (LSCF) with samarium doped ceria (SDC) have been extensively used as cathodes for solid oxide fuel cells (SOFCs) to lower its operation temperature. The ability to visualize three-dimensional (3D) microstructural changes in LSCF-SDC composite cathodes can help elucidate the impact of microstructure on cathode performance. This study reports that we utilize the nano-computed tomography (nano-CT) technique to image the 3D microstructures of La0.4Sr0.6Co0.2Fe0.8O3 (LSCF) - Ce0.8Sm0.2O1.9 (SDC) composite cathodes which were sintering at 800, 1000, and 1200°C, respectively, for 2 h based on the Fe K-absorption edge. Using the reconstructions of LSFC-SDC composite cathodes submitted to different temperatures, the key microstructural properties, such as volume fraction of each phase, connected volume fraction, surface area, triple-phase boundary length, and pore size were measured. The effect of sintering temperature on the microstructure of LSFC-SDC cathodes was discussed and compared with theoretical simulation. With increasing sintering temperature in the range from 800 to 1200°C LSFC-SDC composite cathode microstructure was found that the volume fraction and grain size of LSCF material increased, while the volume fraction of SDC decreased. Furthermore, the triple-phase boundary length per volume increased as the sintering temperature increasing. This study had revealed that the nano-CT can provide a powerful tool to investigate the 3D microstructure of energy materials and optimize its preparation condition to gain better functional performance.

Paper Details

Date Published: 26 September 2013
PDF: 6 pages
Proc. SPIE 8851, X-Ray Nanoimaging: Instruments and Methods, 885112 (26 September 2013); doi: 10.1117/12.2026149
Show Author Affiliations
Yong Guan, Univ. of Science and Technology of China (China)
Xin Pan, Univ. of Science and Technology of China (China)
Gang Liu, Univ. of Science and Technology of China (China)
Zhiting Liang, Univ. of Science and Technology of China (China)
Shan Chen, Univ. of Science and Technology of China (China)
Xiaobo Zhang, Univ. of Science and Technology of China (China)
Ying Xiong, Univ. of Science and Technology of China (China)
Yangchao Tian, Univ. of Science and Technology of China (China)
Changrong Xia, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 8851:
X-Ray Nanoimaging: Instruments and Methods
Barry Lai, Editor(s)

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