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Proceedings Paper

Miniaturized FT-IR spectrometer for industrial process measurements
Author(s): Esko Herrala; Pentti Niemela; Tapio Hannula
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Paper Abstract

There have been made some attempts to transfer the advantages of FT-JR to industrial use. Commercially available research grade instruments have been large and rather expensive. However in many potential applications only medium resolution is required which means that the mirror displacement in a Michelson type interferometer remains short and computation of the Fourier transform can be executed by a small computer. Medium resolution gives also other advantages in spectrometer design simple source and detector optics less severe requirements for mirror transport and small size. We have used a Michelson type interferometer where the moving mirror is suspended by two flexures and driven by a coil actuator. Displacement of the mirror is monitored using moire transducer which is much smaller and has better thermal stability than the conventionally used HeNe laser. The beamsplitter is a standard CaF2/Si and a thermoelectrically cooled PbSe is used as the detector. In the present prototype data is transferred via parallel bus to a PC/AT compatible computer where the necessary mathematics is done. The spectral range is from 5000 to 1800 cm1 with resolution better than 8 cm1. Interferograins can be recorded several times per second and the computation time for a 2000 point spectrum is 10 seconds. Results of environmental tests carried out for the spectrometer will be presented. The results show that it is possible to construct a simple rugged and inexpensive FT-IR spectrometer

Paper Details

Date Published: 1 August 1990
PDF: 5 pages
Proc. SPIE 1266, In-Process Optical Measurements and Industrial Methods, (1 August 1990); doi: 10.1117/12.20261
Show Author Affiliations
Esko Herrala, Technical Research Ctr. of Finland (Finland)
Pentti Niemela, Technical Research Ctr. of Finland (Finland)
Tapio Hannula, Technical Research Ctr. of Finland (Finland)


Published in SPIE Proceedings Vol. 1266:
In-Process Optical Measurements and Industrial Methods
H. A. Macleod; Peter Langenbeck, Editor(s)

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