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Proceedings Paper

Tuning properties of long-period gratings by atomic layer deposited zinc oxide nano-coating
Author(s): Mateusz Śmietana; Marcin Myśliwiec; Jakub Grochowski; Wojtek J. Bock; Predrag Mikulic; Łukasz Wachnicki; Bartłomiej S. Witkowski; Marek Godlewski
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Paper Abstract

This work presents an application of thin zinc oxide (ZnO) films obtained using atomic layer deposition (ALD) for effective tuning of spectral response and the refractive-index (RI) sensitivity of long-period gratings (LPGs). The technique allows for an efficient and well controlled deposition at monolayer level of excellent quality nano-films as required for optical sensors. The effect of ZnO deposition on spectral properties of the LPGs is discussed. We correlated the increase in ZnO thickness with the shift of the LPG resonance wavelength and proved that similar films are deposited on fibers and silicon reference samples in the same process run. The thin overlay effectively changes the distribution of the cladding modes and thus also tunes the device’s RI sensitivity. The tuning can be simply realized by varying number of cycles, which is proportional to thickness of the high-refractive-index (n<1.9 in infrared spectral range) ZnO film. The advantage of this approach is precision in determining the film thickness resulting in RI sensitivity of the LPGs.

Paper Details

Date Published: 20 May 2013
PDF: 4 pages
Proc. SPIE 8794, Fifth European Workshop on Optical Fibre Sensors, 879413 (20 May 2013); doi: 10.1117/12.2025800
Show Author Affiliations
Mateusz Śmietana, Warsaw Univ. of Technology (Poland)
Marcin Myśliwiec, Warsaw Univ. of Technology (Poland)
Jakub Grochowski, Warsaw Univ. of Technology (Poland)
Wojtek J. Bock, Univ. du Québec en Outaouais (Canada)
Predrag Mikulic, Univ. du Québec en Outaouais (Canada)
Łukasz Wachnicki, Institute of Physics (Poland)
Bartłomiej S. Witkowski, Institute of Physics (Poland)
Marek Godlewski, Institute of Physics (Poland)


Published in SPIE Proceedings Vol. 8794:
Fifth European Workshop on Optical Fibre Sensors
Leszek R. Jaroszewicz, Editor(s)

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