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Proceedings Paper

Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser
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Paper Abstract

X-ray free electron lasers (XFELs) with intense and ultra-short pulse X-rays possibly induce damage to optical elements. We investigated the damage thresholds of optical materials by using focusing XFEL beams with sufficient power density for studying ablation phenomena. 1-μm focusing beams with 10 keV photon energy were produced at the XFEL facility SACLA (SPring-8 Angstrom Compact free electron LAser). The focusing beams irradiated samples of rhodium-coated substrate, which is used in X-ray mirror optics, under grazing incident condition.

Paper Details

Date Published: 27 September 2013
PDF: 7 pages
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); doi: 10.1117/12.2025377
Show Author Affiliations
T. Koyama, Japan Synchrotron Radiation Research Institute (Japan)
H. Yumoto, Japan Synchrotron Radiation Research Institute (Japan)
K. Tono, Japan Synchrotron Radiation Research Institute (Japan)
T. Sato, RIKEN SPring-8 Ctr. (Japan)
T. Togashi, Japan Synchrotron Radiation Research Institute (Japan)
Y. Inubushi, RIKEN SPring-8 Ctr. (Japan)
T. Katayama, Japan Synchrotron Radiation Research Institute (Japan)
J. Kim, Osaka Univ. (Japan)
S. Matsuyama, Osaka Univ. (Japan)
H. Mimura, The Univ. of Tokyo (Japan)
M. Yabashi, RIKEN SPring-8 Ctr. (Japan)
K. Yamauchi, Osaka Univ. (Japan)
H. Ohashi, Japan Synchrotron Radiation Research Institute (Japan)


Published in SPIE Proceedings Vol. 8848:
Advances in X-Ray/EUV Optics and Components VIII
Ali Khounsary; Shunji Goto; Christian Morawe, Editor(s)

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