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Proceedings Paper

Characteristics of a ceramic-substrate x-ray diode and its application to computed tomography
Author(s): Manabu Watanabe; Eiichi Sato; Hajime Kodama; Osahiko Hagiwara; Hiroshi Matsukiyo; Akihiro Osawa; Toshiyuki Enomoto; Shinya Kusachi; Shigehiro Sato; Akira Ogawa
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Paper Abstract

X-ray photon counting was performed using a silicon X-ray diode (Si-XD) at a tube current of 2.0 mA and tube voltages ranging from 50 to 70 kV. The Si-XD is a high-sensitivity Si photodiode selected for detecting X-ray photons, and Xray photons are directly detected using the Si-XD without a scintillator. Photocurrent from the diode is amplified using charge-sensitive and shaping amplifiers. To investigate the X-ray-electric conversion, we performed the event-pulseheight (EPH) analysis using a multichannel analyzer. Photon-counting computed tomography (PC-CT) is accomplished by repeated linear scans and rotations of an object, and projection curves of the object are obtained by the linear scan. The exposure time for obtaining a tomogram was 10 min at a scan step of 0.5 mm and a rotation step of 1.0°. In PC-CT at a tube voltage of 70 kV, the image contrast of iodine media fell with increasing lower-level voltage of the event pulse using a comparator.

Paper Details

Date Published: 26 September 2013
PDF: 5 pages
Proc. SPIE 8853, Medical Applications of Radiation Detectors III, 885304 (26 September 2013); doi: 10.1117/12.2025364
Show Author Affiliations
Manabu Watanabe, Toho Univ. School of Medicine (Japan)
Eiichi Sato, Iwate Medical Univ. (Japan)
Hajime Kodama, Toho Univ. School of Medicine (Japan)
Osahiko Hagiwara, Toho Univ. School of Medicine (Japan)
Hiroshi Matsukiyo, Toho Univ. School of Medicine (Japan)
Akihiro Osawa, Toho Univ. School of Medicine (Japan)
Toshiyuki Enomoto, Toho Univ. School of Medicine (Japan)
Shinya Kusachi, Toho Univ. School of Medicine (Japan)
Shigehiro Sato, Iwate Medical Univ. (Japan)
Akira Ogawa, Iwate Medical Univ. (Japan)

Published in SPIE Proceedings Vol. 8853:
Medical Applications of Radiation Detectors III
H. Bradford Barber; Hans Roehrig, Editor(s)

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