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Proceedings Paper

Insights into accelerated aging of SSL luminaires
Author(s): J. Lynn Davis; Michael Lamvik; James Bittle; Sarah Shepherd; Robert Yaga; Nick Baldasaro; Eric Solano; Georgiy Bobashev
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Paper Abstract

Although solid-state lighting (SSL) products are often intended to have product lifetimes of 15 years or more, the rapid change in technology has created a need for accelerated life tests (ALTs) that can be performed in the span of several months. A critical element of interpreting results from any systems-level ALT is understanding of the impact of the test environment on each component. Because of its ubiquity in electronics, the use of temperature-humidity environments as potential ALTs for SSL luminaires was investigated. Results from testing of populations of three commercial 6” downlights in environments of 85°C and 85% relative humidity (RH) and 75°C and 75% RH are reported. These test environments were found to accelerate lumen depreciation of the entire luminaire optical system, including LEDs, lenses, and reflectors. The effects of aging were found to depend strongly on both the optical materials that were used and the design of the luminaire; this shows that the lumen maintenance behavior of SSL luminaires must be addressed at the optical systems level. Temperature-Humidity ALTs can be a useful test in understand lumainaire depreciation provided that proper consideration is given to the different aging rates of various materials. Since the impact of the temperature-humidity environment varies among components of the optical system, uniform aging of all system components in a single test is difficult to achieve.

Paper Details

Date Published: 30 September 2013
PDF: 10 pages
Proc. SPIE 8835, LED-based Illumination Systems, 88350L (30 September 2013); doi: 10.1117/12.2025295
Show Author Affiliations
J. Lynn Davis, RTI International (United States)
Michael Lamvik, RTI International (United States)
James Bittle, RTI International (United States)
Sarah Shepherd, RTI International (United States)
Robert Yaga, RTI International (United States)
Nick Baldasaro, RTI International (United States)
Eric Solano, RTI International (United States)
Georgiy Bobashev, RTI International (United States)

Published in SPIE Proceedings Vol. 8835:
LED-based Illumination Systems
Jianzhong Jiao, Editor(s)

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