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Proceedings Paper

Multiresolution image processing for rough defect classification
Author(s): Johannes Giet; Bernd Kleinemeier
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Paper Abstract

A special application case of multiresolutlon image processing is pointed out. From the imager's original picture. a set of image copies is derived. Each of these copies is generated with different demagnification factors along both image coordi- nates. Simple compact object structures are demagnifled from picture to picture and appear in a specific reduced image as single pixels. For a real-time application, a tailored hardware solution was constructed, which involves a special filter design to minimize accumulation of anti-allasing errors. The application for rough defect classification during strip material fabrication is discussed. In this case, flaws of a given length/width ratio can easily be detected by simple, minimum templates.

Paper Details

Date Published: 1 August 1990
PDF: 11 pages
Proc. SPIE 1265, Industrial Inspection II, (1 August 1990); doi: 10.1117/12.20250
Show Author Affiliations
Johannes Giet, Technologie Zentrum Nord (Germany)
Bernd Kleinemeier, Fachhochschule Lippe (Germany)

Published in SPIE Proceedings Vol. 1265:
Industrial Inspection II
Donald W. Braggins, Editor(s)

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