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Proceedings Paper

Scanning coherent x-ray microscopy as a tool for XFEL nanobeam characterization
Author(s): Andreas Schropp; Robert Hoppe; Jens Patommel; Frank Seiboth; Fredrik Uhlén; Ulrich Vogt; Hae Ja Lee; Bob Nagler; Eric C. Galtier; Ulf Zastrau; Brice Arnold; Philip Heimann; Jerome B. Hastings; Christian G. Schroer
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Paper Abstract

During the last years, scanning coherent x-ray microscopy, also called ptychography, has revolutionized nanobeamcharacterization at third generation x-ray sources. The method yields the complete information on the complex valued, nanofocused wave field with high spatial resolution. In an experiment carried out at the Matter in Extreme Conditions (MEC) instrument at the Linac Coherent Light Source (LCLS) we successfully applied the method to an attenuated nanofocused XFEL beam with a size of 180(h) × 150(v)nm2 (FWHM) in horizontal (h) and vertical direction (v), respectively. It was created by a set of 20 beryllium compound refractive lenses (Be-CRLs). By using a fast detector (CSPAD) to record the diffraction patterns and a fast implementation of the phase retrieval code running on a graphics processing unit (GPU), the applicability of the method as a real-time XFEL nanobeam diagnostic is highlighted.

Paper Details

Date Published: 27 September 2013
PDF: 8 pages
Proc. SPIE 8849, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X, 88490R (27 September 2013); doi: 10.1117/12.2024784
Show Author Affiliations
Andreas Schropp, Technische Univ. Dresden (Germany)
SLAC National Accelerator Lab. (United States)
Robert Hoppe, Technische Univ. Dresden (Germany)
Jens Patommel, Technische Univ. Dresden (Germany)
Frank Seiboth, Technische Univ. Dresden (Germany)
Fredrik Uhlén, KTH Royal Institute of Technology (Sweden)
Ulrich Vogt, KTH Royal Institute of Technology (Sweden)
Hae Ja Lee, SLAC National Accelerator Lab. (United States)
Bob Nagler, SLAC National Accelerator Lab. (United States)
Eric C. Galtier, SLAC National Accelerator Lab. (United States)
Ulf Zastrau, SLAC National Accelerator Lab. (United States)
Brice Arnold, SLAC National Accelerator Lab. (United States)
Philip Heimann, SLAC National Accelerator Lab. (United States)
Jerome B. Hastings, SLAC National Accelerator Lab. (United States)
Christian G. Schroer, Technische Univ. Dresden (Germany)


Published in SPIE Proceedings Vol. 8849:
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X
Annie Klisnick; Carmen S. Menoni, Editor(s)

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