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Proceedings Paper

Estimating hemispherical scatter from incident plane measurements of isotropic samples scattering from both bulk and surface irregularities
Author(s): John C. Stover; Sven Schroeder; Alexander von Finck; David Unglaub; Angela Duparré
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Paper Abstract

In the mid-1970’s it became apparent that incident plane scatter data could be represented by simple two or three parameter expressions. This realization made possible the generation of stray light estimation codes which are used on everything from military weapons, to telescopes, to car headlights to flat panel display systems. Almost all of these applications estimate hemispherical scatter from incident plane measurements. The authors’ 2012 review of this process was limited to samples scattering just from surface roughness. In this paper hemispherical measurements are compared to calculations made from incident plane measurements using isotropic samples that scatter from bulk irregularities as well as surface scatter. The issue of non-isotropic samples is briefly introduced. The data is also analyzed to investigate reciprocity.

Paper Details

Date Published: 7 September 2013
PDF: 8 pages
Proc. SPIE 8838, Optical Manufacturing and Testing X, 883803 (7 September 2013); doi: 10.1117/12.2024550
Show Author Affiliations
John C. Stover, The Scatter Works Inc. (United States)
Sven Schroeder, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Alexander von Finck, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
David Unglaub, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Angela Duparré, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)


Published in SPIE Proceedings Vol. 8838:
Optical Manufacturing and Testing X
Oliver W. Fähnle; Ray Williamson; Dae Wook Kim, Editor(s)

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