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Proceedings Paper

Full-field Fourier fringe analysis for industrial inspection
Author(s): Andrew A. Malcolm; David R. Burton; Michael J. Lalor
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Paper Abstract

Surface parameterisation using phase measurement of interferometric fringe patterns is supported by a strong theoretical basis. However, little work has been published with regard to the practical implementation of the available methods as tools for industrial inspection. This paper attempts to justify the choice of Fourier Fringe Analysis for this purpose and addresses some aspects of its implementation.

Paper Details

Date Published: 1 August 1990
PDF: 14 pages
Proc. SPIE 1265, Industrial Inspection II, (1 August 1990); doi: 10.1117/12.20245
Show Author Affiliations
Andrew A. Malcolm, Liverpool Polytechnic (Singapore)
David R. Burton, Liverpool Polytechnic (United Kingdom)
Michael J. Lalor, Liverpool Polytechnic (United Kingdom)


Published in SPIE Proceedings Vol. 1265:
Industrial Inspection II
Donald W. Braggins, Editor(s)

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