Share Email Print
cover

Proceedings Paper

Weathering and durability of PV backsheets and impact on PV module performance
Author(s): W. Gambogi; Y. Heta; K. Hashimoto; J. Kopchick; T. Felder; S. MacMaster; A. Bradley; B. Hamzavytehraney; V. Felix; T. Aoki; K. Stika; L. Garreau-Illes; T. J. Trout
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Polymeric backsheets form the outer protective layer of most crystalline and multi-crystalline silicon cell photovoltaic panels. The mechanical, electrical, optical and chemical properties and durability of these backsheets are critical to the long term reliability, durability and safety of the photovoltaic modules. The stability of these backsheet properties is typically determined based on accelerated testing using individual stresses. However, the impact of multiple stresses applied sequentially or simultaneously can lead to changes in materials properties that are more predictive of performance in the field. An important consideration in the development of accelerated test protocols is the level and duration of the stress, including temperature variation, light intensity and spectral power distribution, humidity, rainfall and powered module current. In this paper, we discuss observations of the aging and degradation of solar panel from the field. Then how these changes correlate to accelerated testing results, and how accelerated tests can be modified to better match observations in the field.

Paper Details

Date Published: 24 September 2013
PDF: 11 pages
Proc. SPIE 8825, Reliability of Photovoltaic Cells, Modules, Components, and Systems VI, 88250B (24 September 2013); doi: 10.1117/12.2024491
Show Author Affiliations
W. Gambogi, DuPont (United States)
Y. Heta, DuPont K.K. (Japan)
K. Hashimoto, DuPont K.K. (Japan)
J. Kopchick, DuPont (United States)
T. Felder, DuPont (United States)
S. MacMaster, DuPont (United States)
A. Bradley, DuPont (United States)
B. Hamzavytehraney, DuPont (United States)
V. Felix, DuPont (United States)
T. Aoki, DuPont K.K. (Japan)
K. Stika, DuPont (United States)
L. Garreau-Illes, Du Pont de Nemours International S.A. (Switzerland)
T. J. Trout, DuPont (United States)


Published in SPIE Proceedings Vol. 8825:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VI
Neelkanth G. Dhere; John H. Wohlgemuth; Kevin W. Lynn, Editor(s)

© SPIE. Terms of Use
Back to Top