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Proceedings Paper

System high voltage stress degradation test in various photovoltaic modules and encapsulant sheets
Author(s): Han-Chang Liu; Wen-Kuei Lee; Mei-Hsiu Lin; Chung-Teng Huang; Fu-Ming Lin; Jen-Loong Huang
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Paper Abstract

The more and more solar power requirements and balance of system (BOS) cost saving issues, photovoltaic power plants have increasing system voltage, in Europe, for example, the system voltage requirements up to 1000 volts to 1500 volts. Solar module reliability expose to the high voltage stress (HVS) need reassessment. It is well-known that HVS can lower the PV power significantly that means potential induced degradation (PID) effect. However, the effects of the PID and other environmental conditions on module performance have not been included in the IEC qualification standards yet. In this paper we review various PV module type, example MG-Si, poly-Si, CIGS module and encapsulant sheets performance suffer high voltage stress effect. To evaluate module durability in the presence of continuous high voltage we used four accelerated tests to qualify the HVS effect. The first one is under room temperature, 100% relative humidity (RH), second method is room temperature and aluminum foil covered the front sheet, the third method is climatic chamber test at 85℃and 85% RH and the last one is the 60°C and 85%RH with -1000V bias applied to active layer, respectively. The I-V characteristics and Electroluminescence (EL) images have been measured after several time steps to quantify the degradation process of each module. Besides the recovery characterization was also investigation.

Paper Details

Date Published: 24 September 2013
PDF: 7 pages
Proc. SPIE 8825, Reliability of Photovoltaic Cells, Modules, Components, and Systems VI, 88250R (24 September 2013); doi: 10.1117/12.2023644
Show Author Affiliations
Han-Chang Liu, Industrial Technology Research Institute (Taiwan)
Wen-Kuei Lee, Industrial Technology Research Institute (Taiwan)
Mei-Hsiu Lin, Industrial Technology Research Institute (Taiwan)
Chung-Teng Huang, Industrial Technology Research Institute (Taiwan)
Fu-Ming Lin, Industrial Technology Research Institute (Taiwan)
Jen-Loong Huang, Industrial Technology Research Institute (Taiwan)

Published in SPIE Proceedings Vol. 8825:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VI
Neelkanth G. Dhere; John H. Wohlgemuth; Kevin W. Lynn, Editor(s)

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