Share Email Print
cover

Proceedings Paper

The fast measurement of a mild asphere by the vibration-modulated sub-aperture stitching interferometer
Author(s): Hung-Sheng Chang; Po-Chih Lin; Chao-Wen Liang; Yi-Chun Chen; Wei-Yao Hsu; Zong-Ru Yu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Sub-aperture testing methods are widely used in optical shops to test surface deformations of large diameter, high numerical aperture, or aspherical lens surfaces. We are proposing a novel 4 axis vibration modulated interferometer for subaperture testing. This interferometer takes advantage of the rotationally symmetric property of the optical lens and measures the lens surface against its symmetry axis rotationally. By adapting a synchronous random phase modulation measurement, interferometric data is acquired on the fly when the lens is being rotated. The vibration modulated interference phase is then calculated and stitched into a complete lens surface map by least squared fitting. This method has advantages over the prior methods in that it acquires the interferogram in a much shorter acquisition time, even with lower requirements on the optics and mechanical hardware. The stitch error is then significantly decreased by increasing both the lateral resolution of sub-aperture and the reduced position uncertainty of the stitched sub-aperture phase maps. A measurement on a mild asphere is demonstrated to prove the feasibility of the proposed interferometer.

Paper Details

Date Published: 7 September 2013
PDF: 8 pages
Proc. SPIE 8838, Optical Manufacturing and Testing X, 88380C (7 September 2013); doi: 10.1117/12.2023558
Show Author Affiliations
Hung-Sheng Chang, National Central Univ. (Taiwan)
Po-Chih Lin, National Central Univ. (Taiwan)
Chao-Wen Liang, National Central Univ. (Taiwan)
Yi-Chun Chen, National Central Univ. (Taiwan)
Wei-Yao Hsu, Instrument Technology Research Ctr. (Taiwan)
Zong-Ru Yu, Instrument Technology Research Ctr. (Taiwan)


Published in SPIE Proceedings Vol. 8838:
Optical Manufacturing and Testing X
Oliver W. Fähnle; Ray Williamson; Dae Wook Kim, Editor(s)

© SPIE. Terms of Use
Back to Top