Share Email Print

Proceedings Paper

Dual resolution imaging for metrology applications
Author(s): Kevin Harding; Dan Gray
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Many applications require a fine measurement to be made over a small area, but with reference to a much larger area. The ability to inspect a large surface, then to zoom in to a small area is valuable in many applications ranging from bridges to turbines. However, the need to switch lenses or re-point a lens can make such inspection cumbersome. This paper discusses an optical method that permits an instantaneous switch from a wide view to a close up of any area within that wide view, without the need to change lenses or repoint the optical system. We will discuss the possible application of the method, as well as the limitations inherent to the concept.

Paper Details

Date Published: 6 September 2013
PDF: 9 pages
Proc. SPIE 8839, Dimensional Optical Metrology and Inspection for Practical Applications II, 883905 (6 September 2013); doi: 10.1117/12.2023525
Show Author Affiliations
Kevin Harding, GE Global Research (United States)
Dan Gray, GE Global Research (United States)

Published in SPIE Proceedings Vol. 8839:
Dimensional Optical Metrology and Inspection for Practical Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

© SPIE. Terms of Use
Back to Top