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Proceedings Paper

Numerical modeling of scattering type scanning near-field optical microscopy
Author(s): Arvindvivek Ravichandran; Edward C. Kinzel; James C. Ginn; Jeffery A. D'Archangel; Eric Z. Tucker; Brian A. Lail; Markus B. Raschke; Glenn D. Boreman
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Paper Abstract

Apertureless scattering-type Scanning Near-field Optical Microscopy (s-SNOM) has been used to study the electromagnetic response of infrared antennas below the diffraction limit. The ability to simultaneously resolve the phase and amplitude of the evanescent field relies on the implementation of several experimentally established background suppression techniques. We model the interaction of the probe with a patch antenna using the Finite Element Method (FEM). Green's theorem is used to predict the far-field, cross-polarized scattering and to construct the homodyne amplified signal. This approach allows study of important experimental phenomena, specifically the effects of the reference strength, demodulation harmonic, and detector location.

Paper Details

Date Published: 20 September 2013
PDF: 11 pages
Proc. SPIE 8815, Nanoimaging and Nanospectroscopy, 88150S (20 September 2013); doi: 10.1117/12.2023513
Show Author Affiliations
Arvindvivek Ravichandran, Missouri Univ. of Science and Technology (United States)
Edward C. Kinzel, Missouri Univ. of Science and Technology (United States)
James C. Ginn, Plasmonics Inc. (United States)
Jeffery A. D'Archangel, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Eric Z. Tucker, The Univ. of North Carolina at Charlotte (United States)
Brian A. Lail, Florida Institute of Technology (United States)
Markus B. Raschke, Univ. of Colorado at Boulder (United States)
Glenn D. Boreman, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
The Univ. of North Carolina at Charlotte (United States)


Published in SPIE Proceedings Vol. 8815:
Nanoimaging and Nanospectroscopy
Prabhat Verma; Alexander Egner, Editor(s)

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