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Proceedings Paper

Spectrography for 3D analysis from a single spectral view
Author(s): Yan Xi; Jun Zhao; Xiaojing Huang; Hengyong Yu; Yuxin Wang; Ge Wang
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Paper Abstract

In this paper, we extend the spectrography method to visualize 3D structures of complex samples from only one spectral view. Utilizing a weighted difference map and the Fourier central slice theorem, a number of Fourier planes are reconstructed, which go through the origin of the 3D Fourier space and interact with a region formed by the Ewald spheres. Thus, the complex x-ray wave fronts can be recovered at small tilting angles from the incident x-ray beam. Patterns from various computed projections can generate perception of 3D structure features inside the sample. To demonstrate the feasibility of the proposed spectrographic imaging method, numerical simulations are performed and analyzed. The results suggest that spectrography is an effective method for 3D structure studies by a single spectral exposure.

Paper Details

Date Published: 28 September 2013
PDF: 8 pages
Proc. SPIE 8845, Ultrafast Imaging and Spectroscopy, 88450I (28 September 2013); doi: 10.1117/12.2023464
Show Author Affiliations
Yan Xi, Shanghai Jiao Tong Univ. (China)
Jun Zhao, Shanghai Jiao Tong Univ. (China)
Xiaojing Huang, Brookhaven National Lab. (United States)
Hengyong Yu, Wake Forest Univ. Health Sciences (United States)
Yuxin Wang, Argonne National Lab. (United States)
Ge Wang, Rensselaer Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 8845:
Ultrafast Imaging and Spectroscopy
Zhiwen Liu, Editor(s)

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