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Proceedings Paper

Raman analysis of Zn1-xMnxTe polycrystalline films
Author(s): O. V. Klimov; D. I. Kurbatov; A. S. Opanasyuk; V. V. Kosyak; V. Kopach; P. M. Fochuk; A. E. Bolotnikov; R. B. James
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Paper Abstract

In this paper, we have investigated some structural properties, Raman spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions.

Paper Details

Date Published: 26 September 2013
PDF: 5 pages
Proc. SPIE 8852, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV, 88521G (26 September 2013); doi: 10.1117/12.2023280
Show Author Affiliations
O. V. Klimov, Sumy State Univ. (Ukraine)
D. I. Kurbatov, Sumy State Univ. (Ukraine)
A. S. Opanasyuk, Sumy State Univ. (Ukraine)
V. V. Kosyak, The Univ. of Utah (United States)
V. Kopach, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
P. M. Fochuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
R. B. James, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 8852:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV
Michael Fiederle; Arnold Burger; Larry Franks; Ralph B. James, Editor(s)

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