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Proceedings Paper

Damage characteristics of platinum/carbon multilayers under x-ray free-electron laser irradiation
Author(s): Jangwoo Kim; Takahisa Koyama; Hirokatsu Yumoto; Ayaka Nagahira; Satoshi Matsuyama; Yasuhisa Sano; Makina Yabashi; Haruhiko Ohashi; Tetsuya Ishikawa; Kazuto Yamauchi
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Paper Abstract

We evaluated the irradiation damage induced to platinum/carbon multilayers induced by hard X-ray free-electron lasers (XFELs). In this study, in order to test the use of the platinum/carbon multilayers for future XFEL focusing applications, we evaluated the structures in almost exactly the condition in which they would actually be used. The X-ray reflectivity of the multilayers was measured by using XFELs, and a cross-section of the multilayer that was irradiated by an XFEL was observed by transmission electron microscopy. We used a non-monochromatic beam at a photon energy of 10 keV. We confirmed that the intensity of the conditions under which the multilayers are to be used is sufficiently lower than the breakdown threshold of platinum/carbon multilayers.

Paper Details

Date Published: 27 September 2013
PDF: 6 pages
Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480S (27 September 2013); doi: 10.1117/12.2022735
Show Author Affiliations
Jangwoo Kim, Osaka Univ. (Japan)
Takahisa Koyama, Japan Synchrotron Radiation Research Institute/SPring-8 Ctr. (Japan)
Hirokatsu Yumoto, Japan Synchrotron Radiation Research Institute/SPring-8 Ctr. (Japan)
Ayaka Nagahira, Osaka Univ. (Japan)
Satoshi Matsuyama, Osaka Univ. (Japan)
Japan Science and Technology Agency, CREST (Japan)
Yasuhisa Sano, Osaka Univ. (Japan)
Makina Yabashi, RIKEN SPring-8 Ctr. (Japan)
Haruhiko Ohashi, Japan Synchrotron Radiation Research Institute/SPring-8 Ctr. (Japan)
RIKEN SPring-8 Ctr. (Japan)
Tetsuya Ishikawa, RIKEN SPring-8 Ctr. (Japan)
Kazuto Yamauchi, Osaka Univ. (Japan)
Japan Science and Technology Agency, CREST (Japan)


Published in SPIE Proceedings Vol. 8848:
Advances in X-Ray/EUV Optics and Components VIII
Ali Khounsary; Shunji Goto; Christian Morawe, Editor(s)

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