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Proceedings Paper

Multiplex-bands spectral characteristics of infrared perfect absorber metamaterials
Author(s): Yongqian Li; Lei Su; Binbin Wang; Yongjun Guo; Zhenyu Zhu; Zili Zhou
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Paper Abstract

The multiplex-bands absorption of sandwich-structure metamaterials based metal- dielectric- metal scheme are investigated numerically and experimentally. The optical properties of cross-shape antenna perfect absorber metamaterials are demonstrated in mid-IR electromagnetic (EM) wave. The dual-band perfect absorber with polarization independence is observed under normal incidence. In order to understand the EM properties of dual-band perfect absorber, the plasmonic excitation and the induced current distribution were clarified for both peaks. The simulation results clearly show that the absorption bands are independently governed by the size of each part of the patterned nanostructure. The repositioning of two near-perfect absorption peaks possesses a linear relationship. This allows for a flexible reconfigurability over the entire near-infrared regime. Furthermore, in order to obtain multiplex-bands spectral absorption response, two cross-shape antennas are connected to form one dumbbell antenna. The three perfect-absorption peaks can be controlled by the individual dipole antenna elements in the conditions of polarization incident EM wave.

Paper Details

Date Published: 11 September 2013
PDF: 10 pages
Proc. SPIE 8806, Metamaterials: Fundamentals and Applications VI, 880612 (11 September 2013); doi: 10.1117/12.2022624
Show Author Affiliations
Yongqian Li, Northwestern Polytechnical Univ. (China)
Lei Su, Northwestern Polytechnical Univ. (China)
Binbin Wang, Northwestern Polytechnical Univ. (China)
Yongjun Guo, Northwestern Polytechnical Univ. (China)
Zhenyu Zhu, Science and Technology on Metrology and Calibration Lab. (China)
Zili Zhou, Science and Technology on Metrology and Calibration Lab. (China)

Published in SPIE Proceedings Vol. 8806:
Metamaterials: Fundamentals and Applications VI
Allan D. Boardman; Nader Engheta; Mikhail A. Noginov; Nikolay I. Zheludev, Editor(s)

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