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Proceedings Paper

Pattern coding strategies for deflectometric measurement systems
Author(s): Sebastian Höfer; Masoud Roschani; Stefan Werling
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Paper Abstract

In this paper we assess the impact of different error sources on the deflectometric measurement. We provide an overview of previous work in this field and fill the gaps to provide a unified measurement model. The focus is on the parameters of a deflectometric setup with the objective to give practice-oriented guidelines for optimizing the deflectometric data acquisition. We will differentiate between systematic error sources which can be anticipated and compensated for and errors which are intrinsic to the deflectometric measurement method itself. In the later case possible trade-offs between parameters are highlighted to enable the optimization of a setup to a specific application.

Paper Details

Date Published: 24 May 2013
PDF: 11 pages
Proc. SPIE 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, 87911O (24 May 2013); doi: 10.1117/12.2022133
Show Author Affiliations
Sebastian Höfer, Karlsruher Institut für Technologie (Germany)
Masoud Roschani, Karlsruher Institut für Technologie (Germany)
Stefan Werling, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)


Published in SPIE Proceedings Vol. 8791:
Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
Fabio Remondino; Jürgen Beyerer; Fernando Puente León; Mark R. Shortis, Editor(s)

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