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Proceedings Paper

Phase object localization using the statistical behavior of reconstructed wavefronts
Author(s): T. J. T. Abregana; P. F. Almoro
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Paper Abstract

A technique for the localization of 3-D refractive test objects is presented. It uses the statistical behavior of axially propagated wavefronts as a metric to determine object location. The wavefront is obtained using digital holography. The wavefront phase is plotted at equally-spaced axial planes within the wavelength of the light source used. For each transverse phase plot, standard deviation (SD) values are obtained. The axial variation of the SD values yield a contrast map showing the spatial features of the wavefront. To locate the test object along the axial direction, the contrast maps are correlated to a Gaussian test function. The test phase objects objects are transparent adhesive films placed on opposite sides of a 1-mm thick glass slide. This is then mounted approximately 77 mm from the camera plane. Using the proposed technique, the axial distance between the transparent films was determined to be 1.0112mm which indicates the glass slide thickness. The correlation plot yields a well-behaved curve facilitating the precise localization of the test objects.

Paper Details

Date Published: 7 June 2013
PDF: 5 pages
Proc. SPIE 8883, ICPS 2013: International Conference on Photonics Solutions, 88830D (7 June 2013); doi: 10.1117/12.2022106
Show Author Affiliations
T. J. T. Abregana, Univ. of the Philippines (Philippines)
P. F. Almoro, Univ. of the Philippines (Philippines)


Published in SPIE Proceedings Vol. 8883:
ICPS 2013: International Conference on Photonics Solutions
Prathan Buranasiri; Sarun Sumriddetchkajorn, Editor(s)

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